MICROELECTRONICS RELIABILITY

所属栏目:SCI期刊 热度:183

MICROELECTRONICS RELIABILITY

MICROELECTRONICS RELIABILITY

期刊周期:Monthly
研究方向:工程技术
影响因子:1.483
通讯地址:PERGAMON-ELSEVIER SCIENCE LTD, THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD, ENGLAND, OX5 1GB
官网:http://www.journals.elsevier.com/microelectronics-reliability/
投稿地址:http://ees.elsevier.com/mr/
审稿速度:较快,2-4周

  中文简介

《微电子可靠性》致力于传播有关微电子器件、电路和系统可靠性的最新研究成果和相关信息,从材料、工艺和制造,到设计、测试和操作。杂志的内容包括:测量、理解和分析;评估和预测;建模与仿真;方法和缓解。将可靠性与微电子工程的其他重要领域,如设计、制造、集成、测试和现场操作相结合的论文也将受到欢迎,并特别鼓励在该领域和具体应用领域报告实际案例研究的论文。大多数被接受的论文将作为研究论文发表,描述重大进展和完成的工作。审查一般感兴趣的重要发展主题的论文可以作为审查论文发表。可以考虑将性质较初步的紧急来文和关于目前感兴趣的已完成实际工作的简短报告作为研究说明出版。所有的贡献都要经过该领域主要专家的同行审查。其他常规功能包括:?专门讨论重大国际会议或重要发展主题的专题?给编辑的信?行业新闻和更新?即将举行活动的日历?书评微电子可靠性是一个不可或缺的论坛,在学术和工业环境的微电子可靠性专业人士之间,以及所有那些以任何方式与一个稳步增长的微电子工业及其许多应用领域相关的人之间,交流知识和经验。

  英文简介

icroelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.Additional regular features will include:? Special issues devoted to significant international conferences, or to important developing topics? Letters to the Editors? Industrial news and updates? Calendar of forthcoming events? Book reviewsMicroelectronics Reliability is an indispensable forum for the exchange of knowledge and experience between microelectronics reliability professionals from both academic and industrial environments, and all those associated in any way with a steadily growing microelectronics industry and its many fields of application.

  近年期刊自引率趋势图

  JCR分区

JCR分区等级 JCR所属学科 分区 影响因子
Q4 NANOSCIENCE & NANOTECHNOLOGY Q4 1.418
PHYSICS, APPLIED Q4
ENGINEERING, ELECTRICAL & ELECTRONIC Q4

  近年期刊影响因子趋势图

  CiteScore数值

CiteScore SJR SNIP 学科类别 分区 排名 百分位
3.50 0.452 0.851 大类:Engineering 小类:Safety, Risk, Reliability and Quality Q2 62 / 171

64%

大类:Engineering 小类:Electrical and Electronic Engineering Q2 304 / 708

57%

大类:Engineering 小类:Surfaces, Coatings and Films Q2 58 / 129

55%

大类:Engineering 小类:Condensed Matter Physics Q2 191 / 415

54%

大类:Engineering 小类:Atomic and Molecular Physics, and Optics Q2 96 / 205

53%

大类:Engineering 小类:Electronic, Optical and Magnetic Materials Q3 132 / 259

49%

  相关工程技术SCI期刊推荐

SCI服务

搜论文知识网的海量职称论文范文仅供广大读者免费阅读使用! 冀ICP备15021333号-3